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PANalytical Aeris XRD

Determining structure in microcrystalline powders
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MWAC X-ray diffraction lab instrument

Description

General purpose benchtop X-ray diffractometer (XRD) for determining structure in microcrystalline powders.

Specifications

  • 600 W Cu anode – low power but short path length to minimise air attenuation.
  • 6 position sample changer.

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Applications

  • Material structure determination & identification
  • Quantitative phase analysis

Related instruments

Instrument location

X-ray Diffraction Laboratory

Room G65
June Griffith Building (F10)
91É«ÇéƬ Sydney, NSW 2033

Email:Ìýxrdlab@unsw.edu.au

Yu Wang

Senior Technical Officer
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    Email
    yu.wang@unsw.edu.au

Saroj Kumar Bhattacharyya

Technical Officer
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    saroj.bhattacharyya@unsw.edu.au

Moein Seyfouri

Research Fellow Analytical Chemistry Facility
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    Email
    m.seyfouri@unsw.edu.au

Parent facility

X-ray Diffraction Laboratory (XRD)

X-ray diffraction is the most common technique to determine the arrangement of atoms in bulk microcrystalline films and solids. The XRD laboratory hosts 10 diffractometers and 20 processing computers with dedicated software and diffraction databases supportingÌý450 trained users from 91É«ÇéƬÌýand external clients.

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